Friction and Mechanical Properties of AFM-Scan-Induced Ripples in Polymer Films

When compliant samples such as polymer films are scanned with an atomic force microscope (AFM) in contact mode, a periodic ripple pattern can be induced on the sample. In present paper, friction and mechanical properties of structures polystyrene (PS) poly-n-(butyl methacrylate) (PnBMA) investigated. Force volume measurements allow quantitative analysis elastic moduli nanometer resolution, showing contrast response between bundles troughs. Additionally, lateral cantilever deflection when scanning pre-machined ripples shows clear correlation sample topography. Those results support theory crack propagation formation voids mechanism responsible for ripples. This paper also limits presented measuring methods soft, compliant, small structures. Special care must taken to ensure that is not affected by artefacts.